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Stresstech Group´s XSTRESS 3000 X-ray Stress Analyzer offers a highly efficient solution to measuring residual stress and retained austenite content.
XSTRESS 3000 is a small, lightweight, accurate and safe X-ray diffractometer for measuring residual stress and retained austenite content. XSTRESS 3000 measures the stresses on crystalline material by X-rays, based on the phenomenon known as Bragg´s law. XSTRESS 3000 is suitable for both laboratory and field use. As an easily portable residual stress system it makes measurements possible also in difficult conditions in the field like inside a storage tank, in a pipeline or up on a scaffolding. Despite the portability, the unit's alignment procedure have been designed with ease of use in mind, and for high accuracy. XSTRESS 3000 weighs only about 25 kg (55 lb) and can thus be easily loaded, unloaded and carried by one person. It is self contained and only requires the 110 - 240 VAC power supply. From the moment it's been unloaded until it is ready to perform a residual stress measurement it takes only 10 min. Thanks to the implementation of the state of the art, patented, semiconductor detector technology the measurement time on a typical steel sample is 2 minutes or less. The accuracy of residual stress measurement using the XSTRESS 3000 is comparable with large stationary laboratory X-ray diffractometers. It is easy to use yet it is so sophisticated that it will satisfy a most demanding researcher. The X3000 software, allows access to all the test parameters and measurement data at any stage of the measurement routine. XSTRESS 3000 consists of the
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